Close category search window
 

Performance evaluation of multiple input-queued ATM switches with PIM scheduling under bursty traffic

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ge Nong ; Dept. of Comput. Sci., Hong Kong Univ. of Sci. & Technol., China ; Hamdi, M. ; Muppala, J.K.

In this letter, we analyze the performance of multiple input-queued asynchronous transfer mode (ATM) switches that use parallel iterative matching (PIM) for scheduling the transmission of head-of-line cells in the input queues. A queueing model of the switch is developed under independently, identically distributed, two-state Markov modulated Bernoulli processes bursty traffic. The underlying Markov chain of the queueing model is a quasi-birth-death (QBD) chain. The QBD chain is solved using an iterative computing method. Interesting performance metrics of the ATM switch such as the throughput, the mean cell delay, and the cell loss probability can be derived from the model. Numerical results from both the analytical model and simulation are presented, and the accuracy of the analysis is briefly discussed

Published in:
Communications, IEEE Transactions on  (Volume:49 ,  Issue: 8 )

Date of Publication: Aug 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.