Cart (Loading....) | Create Account
Close category search window

On a passivity of the Arnoldi based model order reduction for full-wave electromagnetic modeling

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Balk, I. ; IntelliSense Corp., Wilmington, MA, USA

Progress in MEMS and packaging design has made significant changes in the requirements for modeling tools. In order to design a modern microdevice or interconnect system it is no longer sufficient to limit the analysis to quasielectrostatic modeling due to smaller size and higher operation frequencies of the microdevices. On the other hand, a “full-wave” analysis produces huge systems of equations which require tremendous amounts of computational resources. Many model order reduction algorithms were developed in order to solve this problem. But the passivity of the reduced system is still an issue for “full-wave” models. This paper will describe the Arnoldi based model order reduction algorithm for “full-wave” electromagnetic analysis and will show that this algorithm preserves passivity of the reduced system

Published in:

Advanced Packaging, IEEE Transactions on  (Volume:24 ,  Issue: 3 )

Date of Publication:

Aug 2001

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.