Referenced Items are not available for this document.
This paper treats the test of CMOS digital ICs by using the thermal mapping of the silicon surface as a test observable. Two different temperature-sensing strategies are presented. The novel sensors developed are an on-chip CMOS Differential Temperature (DT) sensor and a Proportional to Absolute Temperature (PTAT) sensor. The sensors are small, robust, effective, and operate without affecting the circuit performance. The sensors have been implemented in a standard .18 μm CMOS technology
Published in:
On-Line Testing Workshop, 2001. Proceedings. Seventh International
Date of Conference: 2001
- Page(s):
- 127 - 132
- Meeting Date :
- 09 Jul 2001-11 Jul 2001
- Print ISBN:
- 0-7695-1290-9
- INSPEC Accession Number:
- 7128205
- Conference Location :
- Taormina
- Digital Object Identifier :
- 10.1109/OLT.2001.937832
- Product Type:
- Conference Publications
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