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CMOS differential and absolute thermal sensors

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4 Author(s)
Syal, A. ; Dept. of Comput. & Electr. Eng., British Columbia Univ., Vancouver, BC, Canada ; Lee, V. ; Andre, I. ; Altet, J.

This paper treats the test of CMOS digital ICs by using the thermal mapping of the silicon surface as a test observable. Two different temperature-sensing strategies are presented. The novel sensors developed are an on-chip CMOS Differential Temperature (DT) sensor and a Proportional to Absolute Temperature (PTAT) sensor. The sensors are small, robust, effective, and operate without affecting the circuit performance. The sensors have been implemented in a standard .18 μm CMOS technology

Published in:

On-Line Testing Workshop, 2001. Proceedings. Seventh International

Date of Conference:

2001