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Increasing the fault coverage in multiple clock domain systems by using on-line testing of synchronizers

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2 Author(s)
Petre, O. ; MESA+ Res. Inst., Enschede, Netherlands ; Kerkhoff, H.G.

As a result of shrinking minimum feature size, IC clock frequencies are increasing and it is no longer possible, nor desired, to stick to a single clock domain. Multiple-clock domain design will no longer be an isolated design style. This new trend in the industry, referred to as future standard by some companies, poses a lot of test problems due to special modules utilized at the interface between clock domains. These modules are called synchronizers. This paper will present an implementation of the on-line concept on two different synchronizers and it will calculate the probability to detect any stuck-at fault

Published in:

On-Line Testing Workshop, 2001. Proceedings. Seventh International

Date of Conference:

2001

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