Cart (Loading....) | Create Account
Close category search window
 

A discrete contextual stochastic model for the off-line recognition of handwritten Chinese characters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yan Xiong ; Hewlett-Packard Co., Palo Alto, CA, USA ; Qiang Huo ; Chan, C.

We study a discrete contextual stochastic (CS) model for complex and variant patterns like handwritten Chinese characters. Three fundamental problems of using CS models for character recognition are discussed, and several practical techniques for solving these problems are investigated. A formulation for discriminative training of CS model parameters is also introduced and its practical usage investigated. To illustrate the characteristics of the various algorithms, comparative experiments are performed on a recognition task with a vocabulary consisting of 50 pairs of highly similar handwritten Chinese characters. The experimental results confirm the effectiveness of the discriminative training for improving recognition performance

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:23 ,  Issue: 7 )

Date of Publication:

Jul 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.