Close category search window
 

High-resolution wavelength monitoring using differential/ratio detection of junction voltage across a diode laser

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
San-Liang Lee ; Dept. of Electron. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan ; Yu-Yi Pisu ; Ching-Tang Pien

High-resolution, compact, and power-insensitive wavelength monitoring can be realized by using a low-cost diode laser as the wavelength sensor. The wavelength resolution can be improved by more than an order with the help of the Fabry-Perot resonance inside the cavity of a diode laser, as well as by differential or ratio detection. Wavelength resolution of 0.01 nm can he obtained with much relaxed requirement on the detection circuitry. The wavelength monitoring with such resolution ran tolerate up to 15 dB of power variation on the incident light power.

Published in:
Photonics Technology Letters, IEEE  (Volume:13 ,  Issue: 8 )

Date of Publication: Aug. 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.