By Topic

An interconnect energy model considering coupling effects

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Uchino, T. ; Toshiba Corp., Kawasaki, Japan ; Cong, J.

This paper first presents an analytical interconnect energy model with consideration of event coupling, which is not considered by the conventional 1/2 CV2 model. Our energy calculation algorithm has the same time complexity as the 1/2 CV2 model, and is several orders of magnitude faster than HSPICE with less than 5% error. In comparison, the error of the 1/2 CV2 model can be as high as 100%.

Published in:

Design Automation Conference, 2001. Proceedings

Date of Conference:

2001