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Effective use of Boolean satisfiability procedures in the formal verification of superscalar and VLIW microprocessors

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2 Author(s)
Velev, M.N. ; Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA ; Bryant, R.E.

We compare SAT-checkers and decision diagrams on the evaluation of Boolean formulas produced in the formal verification of both correct and buggy versions of superscalar and VLIW microprocessors. We identify one SAT-checker that significantly outperforms the rest. We evaluate ways to enhance its performance by variations in the generation of the Boolean correctness formulas. We reassess optimizations previously used to speed up the formal verification and probe future challenges.

Published in:

Design Automation Conference, 2001. Proceedings

Date of Conference:

2001

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