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Scaling trends of cosmic ray induced soft errors in static latches beyond 0.18 /spl mu/

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5 Author(s)
Karnik, T. ; Microprocessor Res. Labs., Intel Corp., Hillsboro, OR, USA ; Bloechel, B. ; Soumyanath, K. ; De, V.
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This paper describes an experiment to characterize soft error rate of static latches for neutrons using a neutron beam, with measured soft error rates as a function of diffusion collection areas and supply voltages. The paper also quantifies the effectiveness of two promising hardening techniques and scaling trends.

Published in:

VLSI Circuits, 2001. Digest of Technical Papers. 2001 Symposium on

Date of Conference:

14-16 June 2001