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S-parameter broad-band measurements on-microstrip and fast extraction of the substrate intrinsic properties

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1 Author(s)
Hinojosa, J. ; Dept. de Electron., Tecnologia de Comput., y Proyectos, Univ. Politecnica de Cartagena, Spain

A broad-band technique for determining the electromagnetic properties of isotropic film-shaped materials, which uses a microstrip line, is presented. Complex permittivity and permeability are computed from analytical equations and S-parameter measurements of microstrip cells propagating the dominant mode. Measured /spl epsiv//sub r/ and μ/sub r/ data for several materials are presented between 0.05 GHz and 40 GHz. This technique shows a good agreement between measured and predicted data.

Published in:

Microwave and Wireless Components Letters, IEEE  (Volume:11 ,  Issue: 7 )