By Topic

Electrooptic beam deflection using the leaky mode of a planar waveguide

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Himel, M.D. ; Center for Res. in Electro-Opt. & Lasers, Univ. of Central Florida, Orlando, FL, USA ; Shi, X. ; Hu, X.Q. ; Moharam, M.G.
more authors

Electrooptic beam deflection using the leaky mode of a TiO/sub 2/ thin-film waveguide in optical contact with a LiNbO/sub 3/ crystal is discussed. Initial measurements yielded a deflection efficiency of 0.34 mrad/kV and suggest potential for more than an order of magnitude improvement. By depositing the waveguide directly onto the electrooptical crystal, a rugged miniature device that has the potential for high-speed operation and an angular deflection efficiency equal to or higher than that of currently available bulk devices can be fabricated. In addition to the strict tolerances on the coating thickness, the deposited films must have extremely low losses, a high refractive index, and be resistant to environmental effects.<>

Published in:

Photonics Technology Letters, IEEE  (Volume:3 ,  Issue: 10 )