Referenced Items are not available for this document.
An algorithm has been developed to implement accelerated life test data analysis for multiple type stress. The advantage is that it combines in one model most of the known life-stress relationships for one or two types of stresses such as the temperature-nonthermal modes. The solution to this model provides the engineers with an opportunity to expand their selection types, stresses and test conditions when the products are tested
Published in:
Electronics Technology: Concurrent Engineering in Electronic Packaging, 2001. 24th International Spring Seminar on
Date of Conference: 2001
- Page(s):
- 306 - 309
- Meeting Date :
- 05 May 2001-09 May 2001
- Print ISBN:
- 0-7803-7111-9
- INSPEC Accession Number:
- 7086357
- Conference Location :
- Calimanesti-Caciulata
- Digital Object Identifier :
- 10.1109/ISSE.2001.931089
- Product Type:
- Conference Publications
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