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TLP calibration, correlation, standards, and new techniques

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4 Author(s)
Barth, J.E. ; Barth Electron. Inc., Boulder City, NV, USA ; Verhaege, K. ; Henry, L.G. ; Richner, J.

This paper describes a constant impedance transmission line pulse system with new measurement capabilities and improved accuracy. The paper enforces a broader look at transmission line pulse (TLP) data, beyond the I-V curves. Accurate TLP measurements and actual TLP/HBM device data are used to demonstrate dV/dt effects and HBM/TLP correlation and miscorrelation. Finally, a calibration method and standard TLP test method are presented for adaptation by the industry. This is necessary to provide correlation and repeatability of experimental data

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Electronics Packaging Manufacturing, IEEE Transactions on  (Volume:24 ,  Issue: 2 )