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Measurement of timing jitter contributions in a dynamic test setup for A/D converters

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3 Author(s)
J. -M. Janik ; Philips Semicond., Caen, France ; D. Bloyet ; B. Guyot

The article provides a new method which permits one to separate and to obtain an accurate estimation of timing jitter contributions appearing in an analog-to-digital (A/D) converter dynamic common test setup. The results are obtained using coherent sampling configuration and are independent of quantization and nonlinearities of the converter

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:50 ,  Issue: 3 )