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A novel approach to the estimation of confidence limits for BJT model sets using a bootstrap technique

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8 Author(s)
Macsweeney, D. ; Nat. Microelectron. Res. Centre, Univ. Coll. Cork, Ireland ; McCarthy, K.G. ; Floyd, L. ; Riordan, M.
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In this paper, a novel method for the estimation of confidence intervals of extracted parameter values is proposed. The technique is based on a bootstrap method which evaluates the error distributions which are associated with parameter extraction techniques. Using this technique, a confidence interval can then be estimated for extracted parameter values. Results are presented for DC, capacitance and high frequency measurements

Published in:

Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on

Date of Conference:

2001