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Improving non-destructive testing probe performance by digital processing techniques

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3 Author(s)
Bernieri, A. ; DAEIMI, Cassino Univ., Italy ; Betta, G. ; Ferrigno, L.

The paper proposes a novel probe for non-destructive testing (NDT) based on eddy currents. The novelty of the probe is in the digital processing algorithms used to extract field information from rough voltage data. The digital signal processing algorithm as well as the working parameters of the NDT probe were experimentally optimized looking for the best compromise between sensitivity and accuracy. Tests carried out on specimen with known cracks highlight the capability of the probe in correctly identifying the crack location and characteristics

Published in:

Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE  (Volume:2 )

Date of Conference:

2001

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