Cart (Loading....) | Create Account
Close category search window
 

Calibration of thickness measurement instruments based on twin laser sensors. Isoline bilinear look up tables

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Spinola, C. ; Dept. de Electron., Malaga Univ., Spain ; Vazquez, M.J.M. ; Bohorquez, A.F. ; Bonelo, J.M.
more authors

We present a procedure for the calibration of an instrument for noncontact thickness measurement of stainless steel sheets, based on a pair of triangulation laser sensors. Firstly, we carry out a general review of the architecture of this kind of instrument and of the problems associated with noncontact measurement based on commercial laser sensors in an industrial production environment. Secondly, we introduce a method for the calibration and characterization of this instrument based on the piecewise linear approximation of the isoline curves obtained in the calibration process (isoline bilinear look-up tables). We follow with a description of the searching and calculation of thickness in these types of tables

Published in:

Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE  (Volume:2 )

Date of Conference:

2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.