Cart (Loading....) | Create Account
Close category search window

Low-loss fluorinated poly(arylene ether sulfide) waveguides with high thermal stability

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Kang, Jae-Wook ; Dept. of Mater. Sci. & Eng., Kwanju Inst. of Sci. & Technol., South Korea ; Jae-Pil Kim ; Won-Young Lee ; Joon-Sung Kim
more authors

Some novel cross-linkable fluorinated poly(arylene ether sulfides) (FPAESI) were synthesized for use in optical waveguide applications. The materials have high thermal stability, high optical transparency in the infrared communication region, and much less birefringence than other thermally stable fluorinated polyimides. The refractive index of FPAESI after storage at 100°C for 1000 h remains almost constant, demonstrating their thermal stability. Furthermore, the refractive index of the material can be easily controlled by changing the fluorine content of the materials. The propagation loss of channel waveguides, which were fabricated using reactive ion etching was less than 0.42 dB/cm and 0.4 dB/cm at the wavelength of 1.55 μm for TE and TM polarizations, respectively

Published in:

Lightwave Technology, Journal of  (Volume:19 ,  Issue: 6 )

Date of Publication:

Jun 2001

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.