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The reliability of approximate testability measures

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1 Author(s)
Huisman, L.M. ; IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA

Techniques for gauging the accuracy of approximate testability measures that estimate the random-pattern testability of gate-level faults in designs with combinational logic are considered. The measures examined are overall fault-exposure distribution, high coverage, and fault grading. Sampling techniques are compared with the Stafan and Protest approximate testability measures. For random-pattern testing, it is clear that state-of-the-art testability measures like Stafan and Protest do provide some information about the testability of single faults or complete designs, but this information is not accurate; in many areas of use they cannot compete with carefully chosen sampling techniques. The three techniques described here are applicable to testing strategies other than the random-pattern testing of stuck-at faults; they are equally useful in a weighted random-pattern testing environment, for example.<>

Published in:

Design & Test of Computers, IEEE  (Volume:5 ,  Issue: 6 )

Date of Publication:

Dec. 1988

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