Cart (Loading....) | Create Account
Close category search window
 

Effect of internal reflections on the radiation properties and input impedance of integrated lens antennas-comparison between theory and measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
van der Vorst, M.J.M. ; Eindhoven Univ. of Technol., Netherlands ; de Maagt, P.J.L. ; Neto, A. ; Reynolds, A.L.
more authors

This paper presents the effect of internal reflections on the beam pattern and input impedance of integrated lens antennas. A silicon lens was designed and manufactured, and measurements were conducted at a frequency of 100 (impedance) and 500 GHz (beam pattern). A frequency-dependence characterization of the beam pattern clearly showed the existence and impact of internal reflections. The measurements confirmed that most of the frequency variations of the beam pattern could be attributed to internal reflections, as predicted by the model. An on-wafer measurement strategy for determining the antenna impedance at millimeter-wave frequencies is presented. The validity of the model was also proven by an excellent match of the input impedance measurements and predictions. Not only the level, but also the oscillation on the impedance curve was predicted accurately. Initial space qualification was performed in the form of thermal cycling

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:49 ,  Issue: 6 )

Date of Publication:

Jun 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.