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Characteristics of Nb-based Josephson junctions at a temperature below 1 K

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9 Author(s)
Ishibashi, K. ; Dept. of Nucl. Eng., Kyushu Univ., Fukuoka, Japan ; Takeno, K. ; Oae, Y. ; Sakae, T.
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A lithographic technique for Josephson LSI (large scale integrated) circuits was applied to the production of a superconducting tunnel junction for radiation detection. Nb-Al/aluminum oxide/Nb tunnel junctions with different junction sizes and barrier oxidation times have been fabricated. The current-voltage curves were measured in the temperature range from 4.2 to 0.45 K. The junctions showed some amounts of leakage current, which remained below 2 K. The behavior of the leakage current was successfully understood from its experimental dependence on the junction size

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Magnetics, IEEE Transactions on  (Volume:25 ,  Issue: 2 )