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On diagnosis and diagnostic test generation for pattern-dependent transition faults

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2 Author(s)
Pomeranz, I. ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA ; Reddy, S.M.

We propose a method of modeling pattern dependence as part of the existing delay fault models without incurring the complexity of considering physical effects that cause pattern dependence. We apply the method to transition faults. We define the conditions under which two pattern-dependent transition faults can be said to be distinguished by a given test set. We provide experimental results to demonstrate the diagnostic resolutions obtained under the proposed model. We also present conditions for identifying pairs of indistinguishable pattern-dependent transition faults and propose a procedure for generating diagnostic tests for distinguishable pattern-dependent transition faults

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:20 ,  Issue: 6 )