Referenced Items are not available for this document.
A multiple-valued input two-valued output logic system (MITOL) is proposed as a description language of software functionality for test case generation purpose. Based on the MITOL description of software functionality, test generation algorithms for multiple-valued logic circuits, such as path sensitization, can be used for test case generation for software system functional testing. The resulting minimum complete test set contains the minimum number of test cases to cover all logical stuck-at-faults. Finally, a comparison of this new method with traditional methods is presented
Published in:
Multiple-Valued Logic, 2001. Proceedings. 31st IEEE International Symposium on
Date of Conference: 2001
- Page(s):
- 35 - 40
- Meeting Date :
- 22 May 2001-24 May 2001
- ISSN :
- 0195-623X
- Print ISBN:
- 0-7695-1083-3
- INSPEC Accession Number:
- 6971546
- Conference Location :
- Warsaw
- Digital Object Identifier :
- 10.1109/ISMVL.2001.924552
- Product Type:
- Conference Publications
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
