Referenced Items are not available for this document.
The paper outlines the requirements for a reusable test executive and reusable test programs. The concepts “custom generic test programs”, “smart parametrization” and test program sets are introduced. Next the process of creating test program sets (TPS) from generic test programs, using a TPS editor, is described. Implementation examples are presented throughout the paper
Published in:
Electrical and ELectronic Engineers in Israel, 2000. The 21st IEEE Convention of the
Date of Conference: 2000
- Page(s):
- 154 - 159
- Meeting Date :
- 11 Apr 2000-12 Apr 2000
- Print ISBN:
- 0-7803-5842-2
- INSPEC Accession Number:
- 7062222
- Conference Location :
- Tel-Aviv
- Digital Object Identifier :
- 10.1109/EEEI.2000.924348
- Product Type:
- Conference Publications
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