Cart (Loading....) | Create Account
Close category search window
 

Flux noise and flux creep in YBCO thin films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Ferrari, M.J. ; Dept. of Phys., California Univ., Berkeley, CA, USA ; Johnson, Mark ; Wellstood, F.C. ; Clarke, John
more authors

The authors used a DC SQUID (superconducting quantum interference device) to measure the low-frequency magnetic flux noise produced by thin-film rings of YBa2Cu3O7-δ (YBCO) with various microstructures. Below the transition temperature T c of the YBCO, the spectral density of the noise scales as 1/f (f is the frequency) from 1 Hz to 1 kHz. This noise generally increases with temperature and vanishes abruptly at Tc . Improvements in crystalline microstructure greatly reduce the magnitude of the noise, which was lowest for a highly orientated sample with its c-axis perpendicular to the substrate. Making a radial cut to interrupt current paths around the sample ring does not significantly affect the magnitude of the noise, demonstrating that the noise arises from a local mechanism such as the thermally activated hopping of flux bundles. Flux creep was observed in one sample cooled in a magnetic field of 1 mT, and the creep rate exhibited a sharp maximum near 80 K. It is concluded that SQUIDs and flux transformers of YBCO must be fabricated from highly orientated films to obtain low noise at low frequencies

Published in:

Magnetics, IEEE Transactions on  (Volume:25 ,  Issue: 2 )

Date of Publication:

Mar 1989

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.