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A physical design tool for built-in self-repairable RAMs

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5 Author(s)
Chakraborty, K. ; EDA Lab., IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA ; Kulkami, S. ; Bhattacharya, M. ; Mazumder, P.
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In this paper, we present the description and evaluation of a novel physical design tool, BISRAMGEN, that can generate reconfigurable and fault-tolerant RAM modules. This tool designs a redundant RAM array with accompanying built-in self-test (BIST) and built-in self-repair (BISR) logic that can switch out faulty rows and switch in spare rows. Built-in self-repair causes significant improvement in reliability, production yield, and manufacturing cost of ASICs and microprocessors with embedded RAMs.

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Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:9 ,  Issue: 2 )