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Using electrical bitmap results from embedded memory to enhance yield

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4 Author(s)
Segal, J. ; HPL, San Jose, CA, USA ; Jee, A. ; Lepejian, D. ; Chu, B.

Analyzing bitmap results can provide insight into physical failure mechanisms normally acquired only through the complex, time-consuming, and expensive process of failure analysis

Published in:

Design & Test of Computers, IEEE  (Volume:18 ,  Issue: 3 )