By Topic

Design and test of large embedded memories: An overview

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Rajsuman, R. ; Advantest America R&D Centre, Santa Clara, CA, USA

Large on-chip memories are desirable but difficult to implement. Challenges range from design automation to fabrication to test algorithms and memory redundancy and repair

Published in:

Design & Test of Computers, IEEE  (Volume:18 ,  Issue: 3 )