Referenced Items are not available for this document.
We describe a CMOS image sensor with column parallel Analog to Digital Conversion circuits. In this method, we use small 1 bit comparator which detects each bit during integration 8 bit value is determined when the integration is finished. Consequently, both the A/D conversion and the integration of the pixel value can be done in parallel. We have designed a prototype by using column parallel architecture. The prototype outputs analog value and 8 bit digital value of pixel data. It has 32×16 pixels and digital memory for each pixel. We describe the processing scheme of our ADC and the circuit and layout design of the prototype. We show results of some experiments
Published in:
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
(Volume:4
)
Date of Conference: 6-9 May 2001
- Page(s):
- 818 - 821 vol. 4
- Meeting Date :
- 06 May 2001-09 May 2001
- Print ISBN:
- 0-7803-6685-9
- INSPEC Accession Number:
- 7042521
- Conference Location :
- Sydney, NSW
- Digital Object Identifier :
- 10.1109/ISCAS.2001.922363
- Product Type:
- Conference Publications
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