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A statistical methodology for the design of high-performance current steering DAC's

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3 Author(s)
P. Crippa ; Dipt. di Elettronica e Autom., Ancona Univ., Italy ; M. Conti ; C. Turchetti

Random device variations are a key factor limiting the performances of high-resolution CMOS current steering D/A converters. In this paper a novel design methodology based on statistical modeling of MOS drain current has been developed. This technique requires firstly an estimation of mean value and autocorrelation function of a single stochastic process, which all the process/device variations are lumped in. Then a behavioral model of D/A converters has been developed. Finally, the statistical simulation of static performances (DNL and INL) has been carried out for different DAC architectures

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Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on  (Volume:5 )

Date of Conference: