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Multiple fault diagnosis of analog circuits by locating ambiguity groups of test equation

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2 Author(s)
J. A. Starzyk ; Sch. of Electr. Eng. & Comput. Sci., Ohio Univ., Athens, OH, USA ; D. Liu

This paper proposes a method to diagnose the multiple faults in linear analog circuits. The test equation establishes the relationship between the measured responses and faulty excitations due to faulty elements. The QR factorization is applied to identify ambiguity groups in the test verification matrix. The suspicious faulty excitations of the minimum size are determined. Faulty parameters are evaluated using the structural incident signal matrix. Finally, this method is illustrated with an example circuit

Published in:

Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on  (Volume:5 )

Date of Conference: