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FeNi and Ti underlayers for vertical recording on rigid disks

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2 Author(s)
Jeanniot, D. ; Bull SA, Les Clayes-sous-Bois ; Bouchand, J.C.

FeNi and Ti underlayers on CoCr disks are studied. It is confirmed that the structure of FeNi thin films is derived from pure Ni cfc structure. Soft magnetic films can be achieved when sputtering conditions are optimized for an Fe2ONi80 target. Sputtering conditions were also studied for Ti layers. It was found that Ti thin films crystallize in the hcp structure. An (002) crystallographic preferred orientation was generally observed, but it can be improved for thinner films and when high cathode voltage is used during deposition. A (100) orientation is observed if high bias voltage is applied to the substrate during deposition. Both structures, when used as underlayers, improve the vertical anisotropy of CoCr, but (100) Ti underlayers lead to a higher vertical anisotropy

Published in:

Magnetics, IEEE Transactions on  (Volume:24 ,  Issue: 6 )

Date of Publication:

Nov 1988

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