Referenced Items are not available for this document.
We report on fabrication of Y1NdxBa2-x Cu3O7-δ and Nd1+xBa2-x Cu3O7-δ thin films deposited by high oxygen pressure dc sputtering. The structural properties are investigated by X-ray diffraction while Scanning Tunneling Microscopy (STM) has been used to determine the surface morphology. The critical temperature and the critical current density are obtained by transport and inductive measurements. The microwave properties have been studied at 19.8 GHz by a dielectric resonator technique. For both compounds highly epitaxial c-axis thin films are routinely obtained on SrTiO3 and LaAlO3 substrates. Depending on the deposition conditions, films characterized by surface resistance comparable of even better than YBa2Cu3O7-δ have been obtained, with a substantial improvement of the structural properties and of the surface morphology. The role played by the Nd/Ba substitution on the growth and on the superconducting properties is discussed
Published in:
Applied Superconductivity, IEEE Transactions on
(Volume:11
,
Issue:
1
)
Date of Publication: Mar 2001
- Page(s):
- 3201 - 3204
- ISSN :
- 1051-8223
- INSPEC Accession Number:
- 6942953
- Digital Object Identifier :
- 10.1109/77.919744
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 07 August 2002
- Issue Date :
- Mar 2001
- Sponsored by :
- The IEEE Council on Superconductivity
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