By Topic

Fabrication and characterization of microstructural evolution and properties of twisted Bi(Pb)-Sr-Ca-Cu-O superconductor tape

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

10 Author(s)
Jun Hyung Lim ; Sch. of Metall. & Mater. Eng., Sungkyunkwan Univ., Suwon, South Korea ; Jinho Joo ; Jung-Gu Kim ; Wansoo Nah
more authors

We fabricated 37 multi-filament Bi-2223 (BSCCO) superconductor tapes and evaluated the effect of twisting on the microstructural evolution such as grain size, grain alignment, and interface morphology, and on the resulting critical current. Twist pitches of the BSCCO tapes are in the range of 70 to 8 mm and uniformly deformed. It was observed that the grain size and the degree of texture decreased with decreasing pitch, probably due to the formation of the irregular interface between the Ag and the filaments. In addition, the critical current of the tapes decreased with decreasing pitch. For the tape having a twist pitch of 8 mm, approximately 50% of the critical current was maintained compared to that of the untwisted tape. The reduction of critical current may be related to the interface irregularity, smaller grain size, poorer texture and presence of cracks due to the induced strain during the twisting processing

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:11 ,  Issue: 1 )