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Noise properties of YBa2Cu3O7-x step-edge junction dc SQUID magnetometers prepared on sapphire substrates

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4 Author(s)
Hae-Ryong Lim ; Korea Res. Inst. of Standard Sci., Taejon, South Korea ; Kim, In‐Seon ; Park, Yong Ki ; Dong Ho Kim

Step-edge YBa2Cu3O7-x (YBCO) dc SQUID magnetometers on sapphire substrates have been fabricated. CeO2 buffer layers and YBCO films were deposited in situ on the low angle (~35°) steps formed on the sapphire substrates with various thickness ratio of YBCO thin film to step height. Noise properties of the magnetometer exhibit quite different behavior according to the thickness ratio. The field noise of the dc SQUID magnetometer was measured to be 100~300 fT/√Hz at 100 Hz and about 1.5 pT/√Hz at 1 Hz with a dc bias method, and 450 fT/√Hz at 1 Hz with an ac bias method

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Applied Superconductivity, IEEE Transactions on  (Volume:11 ,  Issue: 1 )