Cart (Loading....) | Create Account
Close category search window
 

Detection of deep flaws by using a HTS-SQUID in unshielded environment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Jeng, J.T. ; Dept. of Phys., Nat. Taiwan Normal Univ., Taipei, Taiwan ; Yang, S.Y. ; Horng, H.E. ; Yang, H.C.

We reported the nondestructive evaluation of flaws in conductive samples with the high-Tc SQUID operated at 77 K. By nulling the SQUID with an additional compensation, we can sensitively detect the excited magnetic field due to the eddy current around a deep flaw. To investigate the effects of the size and the depth of flaws on the induced magnetic field, the excited magnetic fields as a function of the depth were measured for buried slots with various widths and thickness. Besides, the amplitude and the phase with different excitation frequencies for a fixed slot size are also studied. It was found that for a fixed excitation frequency, the phase of the measured signal linearly responds to the depth of the slot, while the amplitude correlates with the height of the slot. The results are valuable for quantitative evaluation of flaws

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:11 ,  Issue: 1 )

Date of Publication:

Mar 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.