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Bit error rate measurement of a high-speed small-voltage signal using a superconducting transmission line

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4 Author(s)
Shimaoka, K. ; Tsukuba Res Center, SANYI Electr. Co. Ltd., Ibaraki, Japan ; Tokunaga, S. ; Nemoto, M. ; Yoshida, I.

We developed a measuring system that has a magnetically shielded wide-band test fixture mounted on a closed-cycle cryo-cooler, and used this system to investigate the feasibility of cryo-packaging technology for high-Tc superconducting digital electronics. In this work, we evaluated the bit-error-rate (BER) performance of a system in which was installed a 50-Ω standard microstrip line (MSTL) and a YBa2 Cu3Ox microstrip line to a coplanar waveguide (CPW) transmission line converter (MCC). In the experiment, we used 3-Gbps, 2 15-1 pseudo-random binary sequence (PRBS) signals. The temperature of the test fixture was 20 K. Results showed that the BER was 3.74×10-9 for the 50-Ω MSTL when the signal amplitude at the sample was 13.3 mV, and 1.52×10-9 for the MCC when the amplitude was 30.8 mV. The effect of the signal loss and impedance mismatch on the BER is also discussed

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:11 ,  Issue: 1 )