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Line-splitting in high-resolution superconducting tunnel junction EUV detectors

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4 Author(s)
Friedrich, S. ; Lawrence Berkeley Lab., CA, USA ; Hiller, L.J. ; Cunningham, M.F. ; Labov, S.E.

We have developed high-resolution Nb-Al-AlOx-Al-Nb tunnel junction extreme ultra-violet (EUV) detectors. In the energy range between 25 and 70 eV, we have measured an energy resolution of 2.2 eV full-width at half maximum (FWHM). The energy resolution degrades significantly in the energy range between ≈80 and ≈230 eV where the Nb absorber is partially transparent and some of the photons are absorbed in the Al trap layers. We have for the first time observed a distinctly different response for photons absorbed in the Nb and the Al layer of the same junction electrode. We have modeled this effect with Monte-Carlo simulations of the charge generation process in superconducting multilayers

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:11 ,  Issue: 1 )

Date of Publication:

Mar 2001

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