Cart (Loading....) | Create Account
Close category search window
 

Sub-picowatt precision radiometry using superconducting transition edge sensor bolometers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Chervenak, J.A. ; NASA Goddard Space Flight Center, Greenbelt, MD, USA ; Grossman, E.N. ; Reintsema, C.D. ; Irwin, K.D.
more authors

We describe a cryogenic radiometric calibration system suitable for high sensitivity, low background power bolometers. The system uses a variable temperature blackbody source capable of temperatures of 4 to 20 K, whose output covers the sub-millimeter wavelength regime. The detector is an eight-channel, filled-focal-plane array of superconducting transition edge sensor (TES) bolometers. The system is designed to test components of the optical system such as polarizers, filters and stray light suppressors as well as the performance of the detector array elements. The bolometer response to incident submillimeter radiation is measured and compared to the calculated output of the source seen by the bolometer

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:11 ,  Issue: 1 )

Date of Publication:

Mar 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.