Cart (Loading....) | Create Account
Close category search window
 

Random telegraph voltage noise in a Bi2Sr2CaCu2O8+x intrinsic Josephson junction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Saito, A. ; Nagaoka Univ. of Technol., Niigata, Japan ; Hamasaki, K. ; Irie, A. ; Oya, G.

Low frequency noise properties have been investigated in mesa-type Bi2Sr2CaCu2O8+x (BSCCO) intrinsic Josephson junction. The junction area for this mesa was 160 μm×40 μm. The mesa showed highly hysteretic current-voltage characteristic at low temperatures, and had seven discrete-resistive-branches. For the noise measurements only at T~36 K, we observed a rapid increase in the noise voltage spectrum over our entire bandwidth. Large random telegraph voltage noises (RTVN) were only detected for low bias current region of the BSCCO mesa for current biased on the 4th (Ib=6.0 mA) and 5th (Ib=5.0 mA) resistive-branches, and also not observed for all of voltage region at 4.2 K and low bias voltage region, from 1st to 3rd resistive-branches, at 36 K. The measured Sv(f) had the Lorentzian frequency dependence, as expected from the Machlup formula for random telegraph signal. The possible origin of the large RTVN may be thermal fluctuation of the “switchback” voltage Vmin

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:11 ,  Issue: 1 )

Date of Publication:

Mar 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.