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Discussion of "Impact of subcycle transfer switches on distribution system reliability" [and reply]

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4 Author(s)
J. E. Jipping ; Detroit Edison Co., MI, USA ; W. E. Carter ; R. E. Brown ; J. R. Ochoa

J.E. Jipping et al. comment on the paper by R.E. Brown et al. (see ibid., vol.15, no.1, p.442-7, 2000). They point out that the effect of voltage sags should be considered in reliability models. The original authors reply to the comments.

Published in:

IEEE Transactions on Power Systems  (Volume:15 ,  Issue: 4 )