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A low-power low-noise ultrawide-dynamic-range CMOS imager with pixel-parallel A/D conversion

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1 Author(s)
McIlrath, L.G. ; 3D-IC Inc., Somerville, MA, USA

A CMOS image sensor with pixel-parallel analog-to-digital (A/D) conversion fabricated with different array sizes and photodiode types in a three-metal 0.5-μm process is presented. Nominal power dissipation is 40 nW per pixel at VDD=3.3 V. A/D conversion results from sampling a free-running photocurrent-controlled oscillator to give a first-order Σ-Δ sequence. The sensor displays dynamic range capability of greater than 150000:1 and exhibits fixed pattern noise correctable to within 0.1% of signal

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:36 ,  Issue: 5 )

Date of Publication:

May 2001

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