Scheduled System Maintenance:
On May 6th, single article purchases and IEEE account management will be unavailable from 8:00 AM - 5:00 PM ET (12:00 - 21:00 UTC). We apologize for the inconvenience.
By Topic

Measurement of the ramp linearity of extremely linear frequency ramps using a fractional dual loop structure

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Musch, T. ; RF & Microwave Eng. Inst., Ruhr-Univ., Bochum, Germany ; Schiek, B.

A dual loop synthesizer concept based on fractional divider techniques for measuring highly linear analog frequency ramps is presented. Due to the excellent sensitivity of the measurement set-up, relative nonlinearities as low as 10-9 are ascertainable. The measurements obtained with a prototype circuit are shown. They illustrate the expected high sensitivity. Furthermore, a vector network analyzer (VNA) based on this dual loop synthesizer is described which allows for very fast measurements

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:50 ,  Issue: 2 )