Cart (Loading....) | Create Account
Close category search window

Analysis of reflectivity for a beveled corner mirror in semiconductor ring lasers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Mizutani, N. ; Canon Res. Center, Kanagawa, Japan ; Numai, T.

A semiconductor ring laser is expected to be used as a tiny ring laser gyro with low power consumption, which is suitable for mobile systems. However, its corner mirrors may be beveled due to its fabrication processes. Therefore, in this paper, reflectivities of beveled corner mirrors in the semiconductor ring laser are examined. In the analysis here, a guided fundamental mode is expanded into plane waves, and thus vertical confinement of the guided mode is completely incorporated. It is revealed that there is an optimum guiding layer thickness of approximately 0.3 μm to minimize mirror losses in the beveled mirrors. Also, facet reflectivities of equilateral n-polygon shaped ring lasers with beveled mirrors are studied, and it is found that a large n leads to a low threshold current

Published in:

Lightwave Technology, Journal of  (Volume:19 ,  Issue: 2 )

Date of Publication:

Feb 2001

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.