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Angle dependence of magnetoresistance peaks in thin nickel films

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2 Author(s)
Rhee, I. ; Dept. of Phys., Kyungpook Nat. Univ., Taegu, South Korea ; Chan Kim

The angle dependence of magnetoresistance (MR) peaks in thin nickel films was investigated by rotating the sample in two different ways. The phase mixing of the positive M and negative MR signals was observed 1) with the sample located in the same plane as the field and rotated through an axis perpendicular to the field and 2) with the sample located in a plane perpendicular to the field and then rotated. In the latter case, the field difference between the two MR peaks increased. This behavior is well explained by the concept of effective magnetic field

Published in:

Magnetics, IEEE Transactions on  (Volume:37 ,  Issue: 2 )

Date of Publication:

Mar 2001

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