Cart (Loading....) | Create Account
Close category search window

Thermal calculations for buried gas-insulated transmission lines (GIL) and XLPE-cable

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Koch, H. ; EV HGIL, Siemens AG, Erlangen, Germany ; Chakir, A.

The requirements of transmitting high amounts of electrical power with an underground transmission system will cause high performance in low system losses. A comparison between the XLPE-cable and the GIL for the same buried parameters shows that the operating temperature by cable is 1.5 to 2 times higher than those of the GIL. This study shows that the GIL meets this requirement better than the cable and is therefore the most reliable solution. A numerical study and long-term test measurements proved the accuracy of the computer code used for this study. The calculated values are verified with measurement carried out with a long duration test at the IPH Test Laboratory in Berlin, Germany. In this long duration test the GIL has been proven through accelerated ageing for an expected life time of 50 years

Published in:

Power Engineering Society Winter Meeting, 2001. IEEE  (Volume:2 )

Date of Conference:


Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.