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Optimal X¯ chart for concentrated sampling inspection

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3 Author(s)
Qingchuan Liu ; Sch. of Mech. & Production Eng., Nanyang Technol. Inst., Singapore ; Zhang Wu ; Ming Xie

This article presents an optimal algorithm for the design of the X¯ control chart. The objective is to search the optimal sample size and sampling interval which maximize the effectiveness of the X¯ control chart in detecting the process mean shifts, on condition that the false alarm rate is held at a specified level. The design of this chart is applicable for the concentrated sampling inspection, where the allowed number of inspections within a given period is predefined. The effectiveness of the X¯ chart is measured by the out-of-control average time to signal (ATS). The results from the numerical studies have shown that the optimal X¯ chart is able to reduce the out-of-control ATS for the process mean shifts of any size compared to the conventional Shewhart X¯ chart

Published in:

Management of Innovation and Technology, 2000. ICMIT 2000. Proceedings of the 2000 IEEE International Conference on  (Volume:2 )

Date of Conference:

2000