Cart (Loading....) | Create Account
Close category search window
 

A reliability improvement of NN based OCR using rules and committee classifiers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Radevski, V. ; CNRS, Univ. de Paris-Nord, Villetaneuse, France ; Bennani, Y. ; Cakmakov, D.

The ability of Neural Networks (NN) to learn from training samples in order to generate desired decision regions, has been widely used in recent pattern recognition applications. In this paper, the cooperation of two feature families through a committee of NN based classifiers is investigated. The cooperation scheme is based on two stage classification using a combination of rule-based and statistical approaches. The corresponding results that show the significant improvement of the system reliability are also presented.

Published in:

Information Technology Interfaces, 2000. ITI 2000. Proceedings of the 22nd International Conference on

Date of Conference:

16-16 June 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.