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Light trapping and reflection control for silicon thin films deposited on glass substrates textured by embossing

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2 Author(s)
Campbell, P. ; Centre for Photovoltaic Eng., New South Wales Univ., NSW, Australia ; Keevers, M.

A glass substrate texture of pyramids formed by embossing, suitable for polycrystalline silicon solar cells 5-20 μm thick, is described. A monocrystalline silicon wafer textured with inverted pyramids was used as a die. We evaluate antireflection and light trapping properties for an undoped a-Si:H silicon film (volumetric thickness 5.6 μm; no reflector) simultaneously deposited on this texture and sandblasted glass, using total reflectance and transmittance measurements. Jsc enhancement potential from light trapping in equally thick polycrystalline silicon films on the same substrates is estimated to be 6.7 (sandblasted), 8.7 (embossed) mA/cm2. Light trapping characteristics obtained by spectral photoconductance measurements of the specimens are compared

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Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE

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