Cart (Loading....) | Create Account
Close category search window
 

A fundamental approach to transformer thermal modeling. II. Field verification

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Swift, G. ; APT Power Technol., Winnipeg, Man., Canada ; Molinski, T.S. ; Bray, R. ; Menzies, R.

For pt.I see ibid., vol.16, no.2, p.171-5 (2001). This paper has two main objectives. One is to show that the top oil rise thermal model proposed in part I is valid, for a large power transformer in service. The second is to show that there is a convenient way of estimating the parameters without removing the transformer from service. A Manitoba Hydro 250 MVA OFAF transformer was chosen and instrumented with data-gathering equipment. Two twenty-four hour test runs were performed, one in February of 1999 and the other in July of 1999. The most basic parameter to be determined was the rated top oil rise but also found were the top oil line constant and the nonlinearity exponent, commonly given the symbol n. The results are very positive

Published in:

Power Delivery, IEEE Transactions on  (Volume:16 ,  Issue: 2 )

Date of Publication:

Apr 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.